- Broida 1640
Regan Research Group, UCLA
Recent decades have seen huge advances in electron microscopy. Atomic-resolution imaging of beam-hard, static systems in two dimensions is now routine, while sophisticated data acquisition and reconstruction schemes are solving soft, three-dimensional structures. With this progress the frontier of electron microscopy has moved. Often now the goal is less to learn exactly where the atoms are, and more to discover what they are doing. With "in-situ" observations of functional, dynamic systems, we are beginning to address outstanding scientific problems of general interest. In this talk I will describe electron microscopy experiments on active electronic devices, using examples from our work on thermometry, batteries, and post-flash computer memory.